Citations with the tag: ELECTRON microscopy
Results 1 - 50
- Interfacial reaction in the poly-Si/Ta2O5/TiN capacitor system.
Lee, Hoo-Jeong; Sinclair, Robert; Lee, Myeong-Bum; Lee, Hyeon-Deok // Journal of Applied Physics; 1/1/1998, Vol. 83 Issue 1, p139
Presents study which researches the mechanism and origin of the interfacial reaction by using high resolution electron microscopy and energy dispersive spectroscopy of Ta2O5. What interfacial degradation of Ta2O5 caused; Problems associated with Ta2O5; Experimental procedure used to carry out...
- The Industrial Application of Advanced Electron Microscopy.
Jian Li // JOM: The Journal of The Minerals, Metals & Materials Society (TM; Mar2006, Vol. 58 Issue 3, p19
Introduces a series of articles on the industrial application of advanced electron microscopy.
- Making waves with electrons.
Zettl, A. // Nature; 6/10/1993, Vol. 363 Issue 6429, p496
Discusses the applications of scanning tunnelling microscopes (STMs). Study by Crommie et al. on the wave nature of electrons; Study of distinctive electronic behavior; Use for imaging the quantum interference patterns of electrons moving in two dimensional planes; Study of surface states;...
- Looking back.
Zettl, A. // Nature; 7/15/1993, Vol. 364 Issue 6434, p189
Reports on the technique developed by L. Montelius and J.O. Tegenfeldt in using atomic force microscope. Etching of indium phosphide surface into tiny columns that looked like miniature villi; Increase in statistical significance in each scan.
- Evaluating the risk of particle contamination from cleanroom wipers using scanning electron microscopy.
Bhattacharjee, Himansu R.; Paley, Steven J. // Environmental Engineering; Jun98, Vol. 11 Issue 2, p8
Provides information on a study which examined the use of scanning electron microscopy in preventing particle contamination from cleanroom wipers. Discussion of the seminal testing standard conducted by the Institute of Environmental Sciences; Application of scanning electron microscopy.
- A microscanning electron microscope in ultrahigh vacuum for surface microanalysis.
Fukuoka, M.; Sakai, Y.; Tsunoda, K.; Ichinokawa, T. // Review of Scientific Instruments; Sep94, Vol. 65 Issue 9, p2844
A microscanning electron microscope (SEM) coIumn has been constructed as an attachment of an ultrahigh-vacuum chamber with a 70 mm diam flange to observe microstructures on a solid surface. The micro-SEM column is 26 mm diam and 140 mm long and operated in an energy range from 100 eV to 3 keV....
- Materials and processing aspects of CoCrTa/Cr longitudinal recording media. II. Microstructure.
Shen, Y.; Wong, B. Y.; Laughlin, D. E. // Journal of Applied Physics; 12/15/1994, Vol. 76 Issue 12, p8174
Presents information on a study which performed transmission electron microscopy (TEM) and atomic resolution TEM (ARTEM) of CoCrTa/Cr films produced under varying processing conditions. Experimental procedures; Grain size change; Discussion of ARTEM and segregation.
- Layer disordering of GaAs-AlGaAs superlattices by diffusion of laser-incorporated Si.
Epler, J. E.; Ponce, F. A.; Endicott, F. J.; Paoli, T. L. // Journal of Applied Physics; 10/1/1988, Vol. 64 Issue 7, p3439
Focuses on a study which analyzed a two-step process of laser-assisted disordering with several material characterization techniques. Function of the technique; Factors used to correlate the extent of the layer-disordered region; Motive for using transmission electron microscopy (TEM); Benefits...
- New data-acquisition system for spin-polarized scanning electron microscopy (abstract).
Matsuyama, H.; Koike, K. // Journal of Applied Physics; 4/15/1991, Vol. 69 Issue 8, p5889
Presents an abstract of the study 'New Data-Acquisition System for Spin-Polarized Scanning Electron Microscopy.'
- Defect structure in selective area growth GaN pyramid on (111)Si substrate.
Tanaka, Shigeyasu; Kawaguchi, Yasutoshi; Sawaki, Nobuhiko; Hibino, Michio; Hiramatsu, Kazumasa // Applied Physics Letters; 5/8/2000, Vol. 76 Issue 19
A GaN pyramid grown selectively on a (111)Si substrate with a patterned dot structure of a SiO[sub 2] mask, by metalorganic vapor phase epitaxy using AlGaN as an intermediate layer, was characterized by transmission electron microscopy. The dot pattern has an array of 5.0-�m-diameter window...
- Learn to Appreciate the Backscattered Electron.
Nielsen, Charles // R&D Magazine; Jul2000, Vol. 42 Issue 7, p63
Provides information on backscattered electron (BSE). Comparison with secondary electron; Value of BSE images; Impact of the advent of low-vacuum scanning electron microscopy on the plight of BSE; Information on scintillator-type BSE detectors.
- Microscopy in this issue.
Nielsen, Charles // Microscopy; Feb2013, Vol. 62 Issue 1, p1
An introduction to the journal is presented in which the editor discusses transmission electron microscopy.
- McMaster Orders Titan S/TEMs.
Nielsen, Charles // American Ceramic Society Bulletin; Jun2006, Vol. 85 Issue 6, p5
The article reports that National Facility for Ultrahigh-Resolution Electron Microscopy at McMaster University in Canada has purchased Titan� scanning/transmission electron microscopy systems, the world's first commercial systems capable of delivering sub-Angstrom resolution, from FEI Co....
- In vitro and in vivo effects of flubendazole on Echinococcus granulosus metacestodes.
M. Elissondo; L. Ceballos; M. Dopchiz; V. Andresiuk; L. Alvarez; S. S�nchez Bruni; C. Lanusse; G. Denegri // Parasitology Research; Apr2007, Vol. 100 Issue 5, p1003
Abstract??The aim of the present work was to determine the efficacy of flubendazole (FLBZ) againstEchinococcus granulosusmetacestodes by using in vitro and in vivo models. Groups of 50 microcysts developed in vitro, and groups of 10 peritoneal cysts were obtained from Balb C mice with...
- Structural transformation of MoO3 nanobelts into MoS2 nanotubes.
Deepak, Francis Leonard; Mayoral, Alvaro; Yacaman, Miguel Jose // Applied Physics A: Materials Science & Processing; Sep2009, Vol. 96 Issue 4, p861
The structural transformation of MoO3 nanobelts into MoS2 nanotubes using a simple sulfur source has been reported. This transformation has been extensively investigated using electron microscopic and spectroscopic techniques including scanning electron microscopy (SEM), transmission electron...
- Scanning electron microscopy (SEM) and light microscopy (LM) study of important characters in the identification of Sigalionidae (Annelida: Polychaeta).
Aungtonya, Charatsee // Hydrobiologia; Apr2003, Vol. 496 Issue 1-3, p1
Several characters used to distinguish different genera in the family Sigalionidae were studied using light and scanning electron microscopy. Some important characters that have been used in keys to species in the literature were also included. Material from the Andaman Sea off southwestern...
- Fine structure of Chrysomya nigripes (Diptera: Calliphoridae), a fly species of medical importance.
Radchadawan Ngern-klun; Kom Sukontason; Rungkanta Methanitikorn; Roy Vogtsberger; Kabkaew Sukontason // Parasitology Research; Apr2007, Vol. 100 Issue 5, p993
Abstract??The fine structure ofChrysomya nigripesAubertin, a blow fly species of medical importance, is presented using scanning electron microscopy (SEM) to contribute information on the morphology of the adult of this fly species. The surface of the dome-shaped ommatidia exhibits a microscopic...
- Transmission electron microscopy investigations of damage induced by high energy helium implantation in 4H�SiC.
Beaufort, M.F.; Pailloux, F.; Decl�my, A.; Barbot, J.F. // Journal of Applied Physics; 12/1/2003, Vol. 94 Issue 11, p7116
In 4H�SiC, damage created by helium implantation at high fluence (5�10[sup 16] ions cm[sup -2]) and high energy (1.6 MeV) was studied using different techniques of electron microscopy all along the ion path. Around the end of range, conventional transmission electron microscopy was used to...
- Correlation of photoluminescence of (La, Ln) PO4:Eu3+ (Ln�=�Gd and Y) phosphors with their crystal structures.
Hua Lai; Amurisana Bao; Yuming Yang; Yanchun Tao; Hua Yang // Journal of Nanoparticle Research; Dec2008, Vol. 10 Issue 8, p1355
Abstract��Eu3+-doped (La, Ln) PO4 (Ln�=�Gd and Y) phosphors were prepared by a facile co-precipitation method. Their structures and luminescent properties under UV excitation were investigated. Structural characterization of the nanostructured luminescence material was carried out with...
- Electromigration failure by shape change of voids in bamboo lines.
Arzt, E.; Kraft, O.; Nix, W. D.; Sanchez, J. E. // Journal of Applied Physics; 8/1/1994, Vol. 76 Issue 3, p1563
Deals with a study which examined the behavior of electromigration-induced voids in narrow, unpassivated aluminum interconnects, using scanning electron microscopy. Information on electromigration; Methodology of the study; Results and discussion.
- Three-dimensional shapes and structures of lamellar-twinned fcc nanoparticles using ADF STEM.
Lionel C. Gontard; Rafal E. Dunin-Borkowski; Mhairi H. Gass; Andrew L. Bleloch; Dogan Ozkaya // Journal of Electron Microscopy; Jun2009, Vol. 58 Issue 3, p167
Small particles with face-centred cubic structures can have non-single-crystallographic shapes. Here, an approach based on annular dark-field scanning transmission electron microscopy (STEM) is used to obtain information about the crystal sub-units that make up supported and unsupported twinned...
- Phase Identification, Phase Quantification, and Phase Association Determinations Utilizing Automated Mineralogy Technology.
Hagni, Ann M. // JOM: The Journal of The Minerals, Metals & Materials Society (TM; Apr2008, Vol. 60 Issue 4, p33
Automated mineralogy as a function of electron microscopy has been developed over the course of several decades. This article considers phase identification, quantification, and association determinations using QEMSCAN®, which was originally developed at the Commonwealth Scientific and...
- THUEMENELLA CUBISPORA (ASCOMYCETES, XYLARIACEAE), UN HONGO POCO COM�N EN M�XICO.
Medel, Rosario // Acta Botanica Mexicana; 2001, Issue 54, p25
Thuemenella cubispora is a fungus widely distributed in the world but rarely collected in Mexico (only known from the state of Morelos). Here the species is recorded for first time from the state of Quintana Roo and additional information about stroma size as well as a description under electron...
- Macromolecular and Ultrastructural Organization of the Mitotic Chromosome Scaffold.
Donev, Rossen M.; Djondjurov, Lalio P. // DNA & Cell Biology; Feb99, Vol. 18 Issue 2, p97
Using electron microscopy (EM), we have examined three structural domains of the mitotic chromosome scaffold of mouse erythroleukemia (MEL) Friend cells with different morphologic organization: centromeric, intermediate, and telomeric. The intermediate, most extensive, domain exhibited a...
- Double tilt heating specimen holder for surface imaging by reflection electron microscopy using an EM 300 Philips microscope.
Beauvillain, J.; Claverie, A.; Jouffrey, B. // Review of Scientific Instruments; Mar85, Vol. 56 Issue 3, p418
A new type of heating specimen holder which allows reflection electron microscopy (REM) imaging with incident and azimuthal angle control is described. A REM image is presented, from a bulk specimen whose surface was prepared in situ, and shows strong contrasts due to atomic steps.
- Cathodoluminescence system for a scanning electron microscope using an optical fiber for light collection.
Hoenk, Michael E.; Vahala, Kerry J. // Review of Scientific Instruments; Feb89, Vol. 60 Issue 2, p226
We describe a novel light collection system for cathodoluminescence scanning electron microscopy. Cathodoluminescence emitted from the sample surface enters directly into the facet of an optical fiber, which is held less than a millimeter away from the sample to optimize the collection...
- Suggested Standard Operating Procedures (SOPs) for the Preparation of Electron Microscopy Samples for Toxicology/Pathology Studies in a GLP Environment.
Dykstra, Michael J.; Mann, Peter C.; Elwell, Michael R.; Ching, Shelley V. // Toxicologic Pathology; Nov/Dec2002, Vol. 30 Issue 6, p735
We provide a set of Standard Operating Procedures (SOPs) for preparing samples for electron microscopic evaluation that allow storage of samples in the primary fixative for at least 17 years without noticeable degradation, do not compromise the ability to prepare the same samples for standard...
- Annexin 1 localisation in tissue eosinophils as detected by electron microscopy.
Oliani, Sonia M.; Damazo, Amilcar S.; Perretti, Mauro // Mediators of Inflammation; Oct2002, Vol. 11 Issue 5, p287
Background: Human and rodent leukocytes express high levels of the glucocorticoid-inducible protein annexin 1 (ANXA1) (previously referred to as lipocortin 1). Neutrophils and monocytes have abundant ANXA1 levels. Aim: We have investigated, for the first time, ANXA1 ultrastructural expression in...
- Cables of BN-insulated B�C�N nanotubes.
Golberg, D.; Dorozhkin, P. S.; Bando, Y.; Dong, Z.-C.; Grobert, N.; Reyes-Reyes, M.; Terrones, H.; Terrones, M. // Applied Physics Letters; 2/24/2003, Vol. 82 Issue 8, p1275
Nanotubular ropes composed of aligned multiwalled nanotubes having electrically insulating BN-rich outer shells and semiconducting B-C-N inner shells were synthesized through the reaction of aligned (C&Neebar;[SUBx] (x⩽0.1) nanotube mats with boron oxide and nitrogen at ~2000-2110 K. The...
- Kinetics-limited surface structures at the nanoscale.
Huang, Hanchen; Woo, C. H.; Wei, H. L.; Zhang, X. X. // Applied Physics Letters; 2/24/2003, Vol. 82 Issue 8, p1272
This letter presents the evolution of kinetics-limited nanoscale structures during copper thin film deposition. We first calculate the three-dimensional Ehrlich-Schwoebel (3D ES) kinetic barrier of copper using the molecular dynamics/statics method. Based on this calculation, the dimension of...
- Electrical and interfacial characteristics of ultrathin ZrO[sub 2] gate dielectrics on strain compensated SiGeC/Si heterostructure.
Mahapatra, R.; Lee, Je-Hun; Maikap, S.; Kar, G. S.; Dhar, A.; Hwang, Nong-M.; Kim, Doh-Y.; Mathur, B. K.; Ray, S. K. // Applied Physics Letters; 4/7/2003, Vol. 82 Issue 14, p2320
Ultrathin ZrO[sub 2] gate dielectrics have been deposited on strain-compensated Si[sub 0.69]Ge[sub 0.3]C[sub 0.01] layers by rf magnetron sputtering. High-resolution transmission electron microscopy along with energy-dispersive x-ray spectroscopy and x-ray photoelectron spectroscopy show the...
- Is Cu[sub 60]Ti[sub 10]Zr[sub 30] a bulk glass-forming alloy?
Jiang, J. Z.; Saida, J.; Kato, H.; Ohsuna, T.; Inoue, A. // Applied Physics Letters; 6/9/2003, Vol. 82 Issue 23, p4041
The microstructures of Cu[SUB60]Ti[SUB10]Zr[SUB30] alloys fabricated by using two different methods, (rods of 2.5 mm in diameter prepared by a copper-mold casting method, and ribbons of about 0.03 mm in thickness prepared by the melt-spinning method), have been investigated by transmission...
- Nanoparticle-assisted microwave absorption by single-wall carbon nanotubes.
Wadhawan, A.; Garett, D.; Perez, J.M. // Applied Physics Letters; 9/29/2003, Vol. 83 Issue 13, p2683
We report the effects of microwave irradiation on both unpurified and purified iron-catalyzed high-pressure disproportionation (HiPco)-grown single-walled carbon nanotubes (SWNTs) in ultrahigh vacuum. Under microwave irradiation, we observe that unpurified HiPco SWNTs quickly reach temperatures...
- Vacuum breakdown of carbon-nanotube field emitters on a silicon tip.
She, J.C.; Xu, N.S.; Deng, S.Z.; Chen, Jun; Bishop, H.; Huq, S.E.; Wang, L.; Zhong, D.Y.; Wang, E.G. // Applied Physics Letters; 9/29/2003, Vol. 83 Issue 13, p2671
Findings are given from the experimental observation of the vacuum breakdown of carbon-nanotube (CNT) field emitters on a Si tip. The CNTs were grown on the apex of a Si microtip by microwave plasma-enhanced chemical vapor deposition. The electrical contact of the CNT-Si junction was shown to be...
- Surface morphology of ion-beam-irradiated rutile single crystals.
Ishimaru, Manabu; Hirotsu, Yoshihiko; Li, Fuxin; Fuxin Li; Sickafus, Kurt E. // Applied Physics Letters; 12/18/2000, Vol. 77 Issue 25
Ion-beam-induced structural changes in rutile (TiO[sub 2]) have been examined in detail using transmission electron microscopy (TEM). Single crystals of rutile with (100) orientation were irradiated with 360 keV Xe ions at room temperature to a fluence of 4x10[sup 15]/cm[sup 2]. In addition to a...
- Excitonic properties and band alignment in lattice-matched ZnCdSe/ZnMgSe multiple-quantum-well structures.
Bonanni, B.; Pelucchi, E.; Rubini, S.; Orani, D.; Franciosi, A.; Garulli, A.; Parisini, A. // Applied Physics Letters; 01/22/2001, Vol. 78 Issue 4, p434
Lattice-matched Zn[sub 0.85]Cd[sub 0.15]Se/Zn[sub 0.74]Mg[sub 0.26]Se multiple-quantum-well structures were obtained on GaAs(001) using graded-composition In[sub y]Ga[sub 1-y]As layers to match the II-VI lattice parameter to the III-V substrate. Cross-sectional transmission electron microscopy...
- Influence of Si growth temperature for embedding �-FeSi[sub 2] and resultant strain in �-FeSi[sub 2] on light emission from p-Si/�-FeSi[sub 2] particles/n-Si light-emitting diodes.
Suemasu, T.; Negishi, Y.; Takakura, K.; Hasegawa, F.; Chikyow, T. // Applied Physics Letters; 09/17/2001, Vol. 79 Issue 12, p1804
We have fabricated Si/�-FeSi[sub 2] particles/Si structures by reactive deposition epitaxy for �-FeSi[sub 2] and molecular-beam epitaxy (MBE) for Si. It was found that the photoluminescence (PL) intensity of �-FeSi[sub 2] strongly depended on MBE-Si growth temperature for embedding...
- Current transport in InP/In[sub 0.5](Al[sub 0.6]Ga[sub 0.4])[sub 0.5]P self-assembled quantum dot heterostructures using ballistic electron emission microscopy/spectroscopy.
Reddy, C. V.; Narayanamurti, V.; Ryou, J. H.; Dupuis, R. D. // Applied Physics Letters; 03/11/2002, Vol. 80 Issue 10, p1770
Ballistic electron emission microscopy/spectroscopy (BEEM/S) has been employed to image, inject, and investigate the current transport through self-assembled InP quantum dots embedded in InAlGaP barriers. The spectroscopy performed on the dot and off the dot revealed that the charge confinement...
- Microstructure-controlled magnetic properties of the bulk glass-forming alloy Nd[sub 60]Fe[sub 30]Al[sub 10].
Schneider, S.; Bracchi, A.; Samwer, K.; Seibt, M.; Thiyagarajan, P. // Applied Physics Letters; 03/11/2002, Vol. 80 Issue 10, p1749
We report a combination of analytical transmission electron microscopy, small angle neutron scattering, and studies of magnetic properties of the glass-forming alloy Nd[sub 60]Fe[sub 30]Al[sub 10]. These investigations show the existence of an in situ formed finely dispersed nanocrystalline...
- Subpicosecond transmission change in semiconductor�embedded photonic crystal slab: Toward ultrafast optical switching.
Shimizu, Makoto; Ishihara, Teruya // Applied Physics Letters; 4/22/2002, Vol. 80 Issue 16, p2836
We have measured the subpicosecond photoinduced transmission change of the photonic crystal slab, in which inorganic�organic layered perovskite semiconductor is embedded for large optical nonlinearity. It is observed that sharp transmission dips shift to the blue during the irradiation of the...
- Antiphase boundaries in epitaxially grown �-SiC.
Pirouz, P.; Chorey, C. M.; Powell, J. A. // Applied Physics Letters; 1/26/87, Vol. 50 Issue 4, p221
When the surface of �-SiC, grown epitaxially on (001) silicon by chemical vapor deposition, is chemically etched, boundaries appear which may be observed by optical or scanning electron microscopy. Examination by plan-view and cross-sectional transmission electron microscopy shows boundaries...
- Determination of the atomic configuration at semiconductor interfaces.
Ourmazd, A.; Tsang, W. T.; Rentschler, J. A.; Taylor, D. W. // Applied Physics Letters; 5/18/87, Vol. 50 Issue 20, p1417
We describe an approach based on high-resolution transmission electron microscopy (HRTEM), which is capable of directly and sensitively revealing the atomic configuration at compound semiconductor/semiconductor interfaces, and thus show that interfaces normally regarded as atomically smooth can...
- Aluminum spiking at contact windows in Al/Ti-W/Si.
Chang, Peng-Heng; Hawkins, R.; Bonifield, T. D.; Melton, L. A. // Applied Physics Letters; 1/25/88, Vol. 52 Issue 4, p272
Aluminum spike formation through a Ti-W interdiffusion barrier layer at contact windows is studied by cross-sectional transmission electron microscopy for Al-1% Si and Al-2% Cu films. For Ti-W layers thinner than 1000 � Al spikes form in both Al-Si and Al-Cu systems. The two types of Al films...
- Transmission electron microscopy study of the formation of epitaxial CoSi2/Si (111) by a room-temperature codeposition technique.
d�Anterroches, Cecile; Yakupoglu, H. Nejat; Lin, T. L.; Fathauer, R. W.; Grunthaner, P. J. // Applied Physics Letters; 2/8/88, Vol. 52 Issue 6, p434
Co and Si have been codeposited on Si (111) substrates near room temperature in a stoichiometric 1:2 ratio in a molecular beam epitaxy system. Annealing of these deposits yields high-quality single-crystal CoSi2 layers. Transmission electron microscopy has been used to examine as-deposited...
- Applications of polymer electrets for pollution studies.
Pillai, P. K. C.; Khurana, Paramdeep // Applied Physics Letters; 5/2/88, Vol. 52 Issue 18, p1540
The analysis and identification of the pollutants sticking onto the surfaces of electrets prepared from polymethylmethacrylate and polytetrafluoroethylene have been done by scanning electron microscopic, mass spectrometric, and near infrared spectrophotometric techniques. Electret samples...
- New Titles.
Pillai, P. K. C.; Khurana, Paramdeep // BioScience; Nov1976, Vol. 26 Issue 11, p712
The article lists books on life sciences, which include "Principles and Techniques of Electron Microscopy, Biological Applications," Vol. 6, edited by M. A. Hayat, "Progress in Surface and Membrane Science, Vol. 10, edited by D. A. Cadenhead and J. F. Danielli, and "Origin and Early Evolution of...
- Reading List.
Peters, Rita C. // Drug Discovery & Development; Oct2010, Vol. 13 Issue 8, p6
An introduction to the journal is presented in which the editor discusses an article on the use of antibodies as therapies and research tools, exploration of new technologies and applications by Mike May, and the detailed processes that can help to speed up the cycle of research.
- Electron Microscopy of Carbon Nanotubes.
Kiselev, N. A.; Zakharov, D. N. // Crystallography Reports; Jul2001, Vol. 46 Issue 4, p577
High-resolution electron microscopy was used to study multiwall carbon nanotubes obtained by the arc-discharge technique and double- and single-wall nanotubes produced by the arc-discharge catalytic synthesis. The structure of conical layer nanotubes obtained by the CVD technique is...
- Observation of Structural Vacancies in Titanium Monoxide Using Transmission Electron Microscopy.
Valeeva, A. A.; Tang, G.; Gusev, A. I.; Rempel�, A. A. // Physics of the Solid State; Jan2003, Vol. 45 Issue 1, p87
Structural vacancies were directly observed in nonstoichiometric ordered titanium monoxide using high-resolution transmission electron microscopy under a magnification of 4 � 10[SUP6]. The observation of structural vacancies became possible due to their ordering and the formation of continuous...
- Preparation of Monolayers of Nanoparticles for Transmission Electron Microscopy.
Vorob�ev, A. B.; Gutakovskii, A. K.; Prinz, V. Ya.; Seleznev, V. A. // Technical Physics; Jun2000, Vol. 45 Issue 6, p783
A novel procedure of sample preparation for transmission electron microscopy of nanoparticles is proposed yielding a monolayer of nanoparticles. The procedure offers the possibility of sorting nanoparticles by size and studying the influence of external fields on their arrangement. This...