products & literature

September 2012
Advanced Materials & Processes;Sep2012, Vol. 170 Issue 9, p62
Academic Journal
Product Review
The article previews several advancer materials, including the Surftest SJ-411/412 portable surface roughness tester from Mitutoyo America Corp., the SU3500 variable pressure scanning electron microscope from Hitachi High-Technologies and the Automag Compact automated magnetic filter from Eclipse Magnetics.


Related Articles

  • Variable pressure SEM.  // Pharmaceutical Technology Europe;Aug2010, Vol. 22 Issue 8, p38 

    The article evaluates the SU1510 variable pressure scanning electron microscope (SEM) from Hitachi High-Technologies Corp.

  • MAGNETIC FILTER REDUCES MACHINE TOOL OPERATING COSTS.  // Modern Machine Shop;Apr2012, Vol. 84 Issue 11, p170 

    The article offers brief information on the Micromag HP50 magnetic filter from Eclipse Magnetics Ltd.

  • Metal attraction.  // Process Engineering;Dec2011 Supplement, p40 

    The article presents information about magnetic filter Filtramg FM2.5 from Eclipse Magnetics Ltd.

  • TESTING CHARACTERIZATION.  // Advanced Materials & Processes;Oct2010, Vol. 168 Issue 10, p10 

    The article offers news briefs related to materials testing in Germany. A technique for cutting thin slices of semiconductor for transistors was developed by researchers from Karlsruhe Institute. New insight into the rearrangement of atoms in crystal as the material is bent down and shaped is...

  • Variable pressure SEM introduced.  // R&D Magazine;Aug2003, Vol. 45 Issue 8, p13 

    Reports on the launch of S-4300SE/N field emission variable pressure scanning electron microscope (FEVPSEM) by Hitachi High-Tech Technologies in August 2003. Pressures range of the FEVPSEM; Features of the devices; Advantages of using the device.

  • PRODUCT BRIEFS.  // Medical Device Daily;8/8/2008, Vol. 12 Issue 172, p10 

    The article presents medical device updates including the launching of AccuCup, a liquid-dispensing dosage cup from Comar and the introduction of the SU8000 Field Emission Scanning Electron Microscope (FE-SEM) from Hitachi High-Technologies.

  • Product Showcase.  // Insight: Non-Destructive Testing & Condition Monitoring;Nov2011, Vol. 53 Issue 11, p640 

    The article offers brief information on several electronic products including the FAG DTECT X1 online condition monitoring system from Schaeffler Industrial Aftermarket Services, the NDT MainCal Wireless Radiation Alarm System from NDT MainCal, and the SU800 Series field emission scanning...

  • Product Showcase.  // Insight: Non-Destructive Testing & Condition Monitoring;Jul2011, Vol. 53 Issue 7, p405 

    The article offers brief information on several nondestructive testing products including GS2020 'EMAT Adaptor' from Sonemat, the Raptor portable ultrasonic imaging flaw detector from NDT Systems Inc., and new SU9000 field emission (FE) scanning electron microscope (SEM) from Hitachi...

  • Coordinate Measuring Machine.  // Medical Design Technology;Apr2006, Vol. 10 Issue 4, p30 

    The article introduces Legex 574 CNC coordinate measuring machine manufactured by Mitutoyo America Corp. The machine combines state-of-the-art design, electronics, computing, sensors and materials to offer substantially enhanced performance. It features an ultra-high accuracy, a large measuring...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics