TITLE

Comment on “Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy” [Appl. Phys. Lett. 75, 2435 (1999)]

AUTHOR(S)
Sabuktagin, Mohammed Shahriar
PUB. DATE
May 2010
SOURCE
Applied Physics Letters;5/24/2010, Vol. 96 Issue 21, p216101
SOURCE TYPE
Academic Journal
DOC. TYPE
Letter
ABSTRACT
A letter to the editor is presented in response to the article "Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy," by T. Meoded, R. Shikler, N. Fried, and Y. Rosenwaks in the May 24, 2010 issue.
ACCESSION #
51059307

 

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