TITLE

Erratum: Soft-X-ray spectra of highly charged Os, Bi, Th, and U ions in anelectron beam ion trap

AUTHOR(S)
Tr�bert, E.; Beiersdorfer, P.; Fournier, K. B.; Chen, M. H.
PUB. DATE
August 2006
SOURCE
Canadian Journal of Physics;Aug2006, Vol. 84 Issue 8, p773
SOURCE TYPE
Academic Journal
DOC. TYPE
Erratum
ABSTRACT
A correction to the article "Soft-X-ray spectra of highly charged Os, Bi, Th, and U ions in an electron beam ion trap" that was published in the September 20, 2006 issue is presented.
ACCESSION #
22986648

 

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