Erratum: “Extracting the Richardson constant: IrOx/n-ZnO Schottky diodes” [Appl. Phys. Lett. 94, 242110 (2009)]

Sarpatwari, K.; Awadelkarim, O. O.; Allen, M. W.; Durbin, S. M.; Mohney, S. E.
August 2009
Applied Physics Letters;8/3/2009, Vol. 95 Issue 5, p059901
Academic Journal
Correction notice
A correction to the article "Extracting the Richardson constant: lrOxl n-zn0 Schottky diodes," in the 2009 is presented.


Related Articles

  • Current-voltage characteristics of long wavelength quantum-well laser diodes. Lau, Pey-Kee; Makino, Toshihiko // Journal of Applied Physics;2/1/1998, Vol. 83 Issue 3, p1183 

    Offers an analysis of the derivatives of the current-voltage characteristics of long wavelength quantum-well laser diodes. Description of the electrical derivative technique; Methodology used in study conducted; Results and analysis of findings.

  • 1.54 um electroluminescence from erbium-doped SiGe light emitting diodes. Chang, Shoou-Jinn; Nayak, Deepak K.; Shiraki, Yasuhiro // Journal of Applied Physics;2/1/1998, Vol. 83 Issue 3, p1426 

    Presents a study which fabricated Er-doped SiGe light emitting diodes. Information on the fabrication process; What the process revealed; How the maximum electroluminescence intensity was obtained; Details on the experiments conducted; Results of the study.

  • True amber LED.  // Aviation Week & Space Technology;3/11/1996, Vol. 144 Issue 11, p77 

    Evaluates a series of diodes which emit amber light, from Lumex Opto-Components Inc. Features; Contact point.

  • Microlithography yields polymers that emit patterns of light. Engellike, Roger // Electronic Design;09/15/97, Vol. 45 Issue 20, p25 

    Presents information on the light-emitting diode (LEDs) which are made of polymeter and was developed by researchers at the University of Rochester in New York and Hewlett-Packard's Solid State Technology Lab, Palo Alto, California. How was the LED created; Who made the pattern for the LED;...

  • High-frequency negative resistance device, patent no. 2,794,917, W. Shockley (Assigned to bell...). S.S // Electronic Design;09/15/97, Vol. 45 Issue 20, p64J 

    Presents information on a diode oscillator device which uses a semiconductive material having a first zone. Indication that a barrier exist between the zones; How are these zones connected.

  • It's the diodes.  // PS: Preventive Maintenance Monthly;Aug97, Issue 537, p15 

    Cites some characteristics of blown diodes. Charred area in the center of the tube; Low resistance to multimeter.

  • Blue-green laser-diode technology moves ahead. Gunshor, Robert L.; Nurmikko, Arto // Laser Focus World;Mar95, Vol. 31 Issue 3, p97 

    Discusses the challenges confronting technologists on improving blue-green laser diodes. Problems on increasing the device lifetime and decreasing the operating wavelength; Development on extending device operation to shorter wavelengths.

  • Naphthalimide side-chain polymers for organic light-emitting diodes: Band-offset engineering and... Cacialli, F.; Friend, R.H.; Bouche, C.-M.; Le Barny, P.; Facoetti, H.; Soyer, F.; Robin, P. // Journal of Applied Physics;2/15/1998, Vol. 83 Issue 4, p2343 

    Provides information on an experiment reporting on the fabrication of efficient green light-emitting diodes using a side-chain random polymer based on a high electron affinity (EA) naphthalimide moiety (PNI). Methodology used to conduct the experiment; Results of the experiment; Information on...

  • Enhanced figure of merit in thermal to electrical energy conversion using diode structures. Hagelstein, P. L.; Kucherov, Y. // Applied Physics Letters;7/15/2002, Vol. 81 Issue 3, p559 

    A characterization of the electrical and thermal properties of thermoelectric diode structures indicates that the figure of merit for thermal to electrical energy conversion is significantly enhanced in our devices over thermoelectric values. Enhancements are due to current injection and...

  • True RMS operation test. Raab, Herman P. // Electronic Design;10/23/97 Supplement, Vol. 45 Issue 23, p9 

    Focuses on the use of a diode, to determine whether your voltmeter or DVM produces true RMS voltmeter readings. Examination of the testing procedure.


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics