Publisher’s Note: “Charge decay characteristics of silicon-oxide-nitride-oxide-silicon structure at elevated temperatures and extraction of the nitride trap density distribution” [Appl. Phys. Lett. 85, 660 (2004)]

Kim, Tae Hun; Sim, Jae Sung; Duk Lee, Jong; Shin, Hyung Cheol; Park, Byung-Gook
November 2004
Applied Physics Letters;11/15/2004, Vol. 85 Issue 20, p4807
Academic Journal
Correction notice
This article was originally published with the fourth author's name misspelled; the correct spelling (Hyung Cheol Shin) appears above. In addition, parentheses were missing from Eq. (14). AIP apologizes for these errors. All online versions of the article have been corrected.


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