TITLE

Erratum: Inverse Fourier transform technique to determine second-order optical nonlinearity spatial profiles [Appl. Phys. Lett. 82, 1362 (2003)]

AUTHOR(S)
Quevedo-Lopez, M.A.; El-Bouanani, M.; Kim, M.J.; Gnade, B.E.; Wallace, R.M.; Visokay, M.R.; LiFatou, A.; Chambers, J.J.; Colombo, L.
PUB. DATE
August 2003
SOURCE
Applied Physics Letters;8/25/2003, Vol. 83 Issue 8, p1679
SOURCE TYPE
Academic Journal
DOC. TYPE
Correction notice
ABSTRACT
Presents a correction to the article 'Effect of N Incorporation on Boron Penetration From P[sub+] Polycrystalline-Si Through HfSi[subx]O[suby] Films,' published in the 2003 issue of the journal 'Applied Physics Letters,' vol. 82.
ACCESSION #
10603796

 

Related Articles

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics