Spatially resolved Poisson strain and anticlastic curvature measurements in Si under large deflection bending

Yang, Wenge; Larson, B. C.; Ice, G. E.; Tischler, J. Z.; Budai, J. D.; Chung, K.-S.; Lowe, W. P.
June 2003
Applied Physics Letters;6/2/2003, Vol. 82 Issue 22, p3856
Academic Journal
A scanning-monochromatic form of differential-aperture x-ray microscopy (DAXM) has been developed that provides micron-resolution depth-resolved dilatational strain measurements. This scanning-monochromatic DAXM technique is applied to measurements of Poisson dilatational strain in 25-μm-thick Si bent into an arch with an apex radius of R=3 mm. Poisson strain measurements agree with anisotropic linear elasticity calculations for a Searle parameter as large as β=1009. Local anticlastic bend radii were shown to oscillate across the arch and reach the R/ν limit for distances less than the plate thickness from the edges, where ν is the anisotropic Poisson’s ratio. © 2003 American Institute of Physics.


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