Mode analysis in He[sup +]-implanted lithium fluoride planar waveguides

Mussi, V.; Somma, F.; Moretti, P.; Mugnier, J.; Jacquier, B.; Montereali, R. M.; Nichelatti, E.
June 2003
Applied Physics Letters;6/2/2003, Vol. 82 Issue 22, p3886
Academic Journal
The depth refractive index profiles of broadband visible-emitting planar waveguides produced in LiF crystals with 1.5- and 2-MeV He[sup +] ions at different doses have been derived from mode analysis. They show that there are two competitive mechanisms responsible for positive and negative modifications of the refractive index in the irradiated volume associated with different processes of energy deposition of the incident ions, so as to induce a complex coloration profile along the penetration direction, which is strongly dependent on the irradiation dose. © 2003 American Institute of Physics.


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