TITLE

Chips to go even tinier with high-res microscope

AUTHOR(S)
Pierce, Julia
PUB. DATE
May 2003
SOURCE
Engineer (00137758);5/16/2003, Vol. 292 Issue 7627, p13
SOURCE TYPE
Periodical
DOC. TYPE
Article
ABSTRACT
Reports on the Circuit Scan 1000 magnetic microscope developed by Brown University in Rhode Island, which enables researchers to detect faults within integrated circuits and micromachinery. Features of the microscope; Components; Plan of integrating the microscope within a magnetic sensor tipped pen.
ACCESSION #
9874149

 

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