Experimental and theoretical study of the properties of plasma containing a hemispherically focused ion beam

Peterson, J. M.; Oleson, N. L.
April 1992
Physics of Fluids B: Plasma Physics;Apr92, Vol. 4 Issue 4, p888
Academic Journal
Argon plasmas were produced in a modified multipole plasma device in which the electrons in the two plasmas were isolated by a hemispherical center grid biased negatively. Whenever ion beams are caused to stream from the driver plasma into the target plasma, an additional cold group of Maxwellian electrons were observed in the target plasma. The objective of this paper is to explore the properties of this double-beam plasma (DP) device. Hopefully, this information would provide a reason for the appearance of the cold electron group. To this end, measurements were made of the ion beam densities, energies, and ion temperatures at various axial distances from the hemispheric’s separating grid. Similarly, movable Langmuir probes and hot emissive probes were used to measure the corresponding electron temperatures, densities, and plasma potentials. All that can be said is that these data would suggest that the additional cold group of electrons could result from the interaction of the ion beam with the target electrons in the path of the ion beam. These cold electrons appear to ride along with the ion beam since they are detected throughout the target plasma, since the cold group of electrons are found everywhere in the target plasma.


Related Articles

  • Results of an experimental study of the properties of ion-beam modes found in a double plasma device containing a hemispherical separating screen. Garner, Charles E.; Oleson, Norman L. // Physics of Fluids B: Plasma Physics;Oct93, Vol. 5 Issue 10, p3455 

    Ion-beam modes have been generated in a double plasma device containing argon in which the driver and target plasmas were separated by a hemispherical screen biased negatively with respect to both plasmas. Making the driver plasma positive with respect to the target plasma resulted in the...

  • A new smoothing method for obtaining the electron energy distribution function in plasmas by the... Fernandez Palop, J.I.; Ballesteros, J.; Colomer, V.; Hernandez, M.A. // Review of Scientific Instruments;Sep95, Vol. 66 Issue 9, p4625 

    Discusses the use of a smoothing method to obtain the electron energy distribution function (EEDF) in plasmas. Evaluation of the second derivative of the I-V characteristic of a probe immersed in the plasma; Comparison with other smoothing techniques; Measurement of the EEDF in an argon dc...

  • Permanent magnet plasma lens. Goncharov, A.; Gorshkov, V.; Gubarev, S.; Dobrovolsky, A.; Protsenko, I.; Brown, I. // Review of Scientific Instruments;Feb2002, Vol. 73 Issue 2, p1001 

    We have designed and fabricated, for the first time, a simple, compact, and low-cost electrostatic plasma lens based on the use of permanent magnets rather than an electrically driven solenoid to establish the magnetic field. Characteristics of the focused ion beam passed through the lens have...

  • Calibration of the heavy ion beam probe parallel plate analyzer using the gas target and reference beam Melnikov, A. V.; Kharchev, N. K.; Eliseev, L. G.; Bondarenko, I. S.; Krupnik, L. I.; Khrebtov, S. M.; Nedzelskij, I. S.; Trofimenko, Yu. V. // Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p308 

    Develops a procedure of fast calibration of the heavy ion beam probe parallel plate analyzer using the gas target and reference beam. Test facility in vitro calibration; Gas target in situ calibration; Nonideal effects in calibration.

  • Heavy ion beam probe systems for tight aspect ratio toKamaKs Melnikov, A. V.; Zimeleva, L. G.; Krupnik, L. I.; Nedzelskij, I. S.; Trofimenko, Y. V.; Minaev, V. B. // Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p316 

    Discusses the specific features of the application of heavy ion beam probe systems to tight aspect ratio tokamaks. Brief description of the observed tokamaks from the viewpoint of the probing beam pass; Optimization procedure; Three-dimensional case.

  • A study for the installation of the TEXT heavy-ion beam probe on DIII-D Edmonds, P. H.; Solano, E. R.; Bravenec, R. V.; Wootton, A. J.; Schoch, P.M.; Crowley, T. P.; Hickok, R. L.; West, W. P.; Leuer, J.; Anderson, P. // Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p320 

    Discusses the results of an assessment of the feasibility of installing the TEXT 2 MeV heavy-ion beam probe (HIBP) on the DIII-D tokamak. Background information on the HIBP diagnostic; Expected diagnostic performance; Design procedure; Key design issues.

  • Stand-alone microprocessor controlled fast sweep Langmuir probe driver. Cheetham, A.D.; Davidson, L.; Jakobsen, J.; Lund, T.; Rayner, J.P. // Review of Scientific Instruments;Sep97, Vol. 68 Issue 9, p3405 

    Describes a power supply and data logger for a Langmuir probe interfaced to a personal computer. Description of the previous Langmuir probe driver; Description of the probe driver system in block form; Noise considerations; Stand-alone control; Testing and evaluation.

  • Status of the electrostatic plasma lens. Goncharov, A. // Review of Scientific Instruments;Feb2002, Vol. 73 Issue 2, p1004 

    The electrostatic plasma lens provides an important tool for the manipulation of high current heavy ion beams with moderate energy of 1–100 keV. Applications can include, for example, high dose ion implantation and particle accelerator injection. Here we briefly review the plasma lens...

  • Probe measurements of electron temperature and density in strongly magnetized plasma. Ratynskaia, S. V.; Ratynskaia, S.V.; Demidov, V. I.; Demidov, V.I.; Rypdal, K. // Review of Scientific Instruments;Sep2000, Vol. 71 Issue 9 

    It was demonstrated that with increasing probe length the electron saturation current becomes more independent of the probe potential. This provides higher accuracy of measurements of the electron density and plasma potential in a strongly magnetized plasma (B>0.1 T). Long probes oriented...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics