TITLE

Electron microdiffraction of faulted regions in Co-Cr and Co-Ni-Cr thin films

AUTHOR(S)
Hono, K.; Demczyk, B. G.; Laughlin, D. E.
PUB. DATE
July 1989
SOURCE
Applied Physics Letters;7/17/1989, Vol. 55 Issue 3, p229
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The planar defects which are commonly observed in deposited Co-Cr and Co-Ni-Cr magnetic thin films have been characterized by electron microdiffraction and trace analysis. It was unambiguously shown that these planar defects are (0001) stacking faults, which are thought to be formed to reduce the growth stress of the film during deposition.
ACCESSION #
9832022

 

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