Time-resolved Raman spectrum of shock-compressed diamond

Gupta, Y. M.; Horn, P. D.; Yoo, C. S.
July 1989
Applied Physics Letters;7/3/1989, Vol. 55 Issue 1, p33
Academic Journal
A method has been developed for time-resolved Raman measurements under shock loading to examine the first-order Raman line of diamond (ω0=1333 cm-1). The diamond samples were subjected to uniaxial strain along the [110] direction to a longitudinal stress of 121 kbar. The observed spectral changes are consistent with frequency shifts calculated according to a phenomenological model used to describe stress effects on the zone center phonons of cubic materials.


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