TITLE

Oscillations of composition near the external surface of Y-Ba-Cu-O thin films

AUTHOR(S)
Bakunin, O. M.; Klotsman, S. M.; Matveev, S. A.; Stepanov, K. A.
PUB. DATE
July 1989
SOURCE
Applied Physics Letters;7/3/1989, Vol. 55 Issue 1, p78
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
An Auger electron spectroscopy study has been made of the depth profiles of films of Y-Ba-Cu-O compounds. The films were produced by electron beam and ion plasma sputtering onto various substrate types. The specimens were annealed in air at temperatures ranging between 450 and 900 °C. The effective diffusion coefficients for the film and substrate constituents have been estimated. The depth profiles of films annealed at 600 °C reveal composition oscillations in the region adjacent to the surface. These composition oscillations are assumed to arise from the phase transformations that occur at 600 °C in films of the Y-Ba-Cu-O system.
ACCESSION #
9831827

 

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