TITLE

Transport critical current density in Bi2Sr2CaCu2Ox single crystals

AUTHOR(S)
Shi, Donglu; Tang, Ming; Chang, Y. C.; Jiang, P. Z.; Vandervoort, K.; Malecki, B.; Lam, D. J.
PUB. DATE
June 1989
SOURCE
Applied Physics Letters;6/5/1989, Vol. 54 Issue 23, p2358
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The transport crystal current density Jc has been measured in Bi2Sr2CaCu2Ox single crystals. With a voltage criterion of 1.0 μV/cm, current density measurements yield Jc values ranging from 300 to 1000 A/cm2 at 77 K and zero field, depending upon crystal quality. The crystals are grown by using a flux method and have a typical size of approximately 10×4×1.5 mm. X-ray diffraction, scanning electron microscopy, electrical resistivity, and magnetization shielding data are reported.
ACCESSION #
9831484

 

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics