TITLE

Transport critical current density in Bi2Sr2CaCu2Ox single crystals

AUTHOR(S)
Shi, Donglu; Tang, Ming; Chang, Y. C.; Jiang, P. Z.; Vandervoort, K.; Malecki, B.; Lam, D. J.
PUB. DATE
June 1989
SOURCE
Applied Physics Letters;6/5/1989, Vol. 54 Issue 23, p2358
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The transport crystal current density Jc has been measured in Bi2Sr2CaCu2Ox single crystals. With a voltage criterion of 1.0 μV/cm, current density measurements yield Jc values ranging from 300 to 1000 A/cm2 at 77 K and zero field, depending upon crystal quality. The crystals are grown by using a flux method and have a typical size of approximately 10×4×1.5 mm. X-ray diffraction, scanning electron microscopy, electrical resistivity, and magnetization shielding data are reported.
ACCESSION #
9831484

 

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