Exponential temperature dependence of the critical transport current in Y-Ba-Cu-O thin films

Yom, S. S.; Hahn, T. S.; Kim, Y. H.; Chu, H.; Choi, S. S.
June 1989
Applied Physics Letters;6/5/1989, Vol. 54 Issue 23, p2370
Academic Journal
We have measured the critical currents in rf-sputtered YBa2Cu3O7-x thin films deposited on polycrystalline yttria-stabilized zirconia substrates as a function of temperature down to 10 K. The dependence of the granular films at low temperature indicated exponential behavior which is similar to the superconductor-normal metal-superconductor (S-N-S) type tunneling junctions. For the films with a grain size of approximately 1 μm, we observed two exponential decay constants, which suggest that Josephson junctions limiting the transport critical current are possible both at the grain boundaries and at twin boundaries.


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