TITLE

Mass and energy dependence of depth resolution in secondary-ion mass spectrometry experiments with iodine, oxygen, and cesium beams on AlGaAs/GaAs multilayer structures

AUTHOR(S)
Meuris, M.; Vandervorst, W.; De Bisschop, P.; Avau, D.
PUB. DATE
April 1989
SOURCE
Applied Physics Letters;4/17/1989, Vol. 54 Issue 16, p1531
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The use of an I+2 and I+ primary ion beam in secondary-ion mass spectrometry measurements was studied to investigate its depth profiling properties. A comparison with the results of a Cs+, O+2, and O+ primary beam was made. Experiments were performed with low impact energy (down to 1.7 keV) and glancing angle of incidence on molecular beam epitaxy AlGaAs-GaAs multilayer structures. The best obtainable decay length of the Al+ signal with an iodine primary beam is 1.1 nm. At low impact energies, no mass dependence on the depth resolution is observed. In these conditions, a useful yield for Al+ of approximately 5×10-5 was obtained with the Cs+ beam and 10-2 with the iodine and oxygen beams.
ACCESSION #
9830876

 

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