Observation of ‘‘slow’’ states in conductance measurements on silicon metal-oxide-semiconductor capacitors

Uren, M. J.; Collins, S.; Kirton, M. J.
April 1989
Applied Physics Letters;4/10/1989, Vol. 54 Issue 15, p1448
Academic Journal
We report the observation of a low-frequency plateau in conductance measurements on silicon metal-oxide-semiconductor capacitors. The signal is consistent with the ‘‘slow’’ states observed by other techniques, in particular those states responsible for 1/f noise in silicon metal-oxide-semiconductor field-effect transistors.


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