TITLE

Enrichment depth profiles in polymer blends measured by forward recoil spectrometry

AUTHOR(S)
Sokolov, J.; Rafailovich, M. H.; Jones, R. A. L.; Kramer, E. J.
PUB. DATE
February 1989
SOURCE
Applied Physics Letters;2/6/1989, Vol. 54 Issue 6, p590
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A novel time-of-flight detector system for He+ forward recoil spectrometry which improves the depth resolution to better than 35 nm has been used to investigate the form of the surface enrichment profile in a protonated (normal) polystyrene (PS)/deuterated polystyrene (d-PS) blend. The volume fraction [lowercase_phi_synonym] of d-PS depends on the depth z as [lowercase_phi_synonym](z)=[lowercase_phi_synonym]∞+([lowercase_phi_synonym]1-[lowercase_phi_synonym]∞) exp(-z/ξ), where [lowercase_phi_synonym]1 and [lowercase_phi_synonym]∞ are the surface and bulk volume fractions of d-PS, respectively, and ξ is approximately the bulk correlation length, as predicted by theory.
ACCESSION #
9829833

 

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