Ion mixing of metal/Al bilayers near 77 K

Ma, E.; Workman, T. W.; Johnson, W. L.; Nicolet, M-A.
January 1989
Applied Physics Letters;1/30/1989, Vol. 54 Issue 5, p413
Academic Journal
The efficiency of interfacial ion mixing is measured for metal/Al (metal=Ti, Cr, Ni, and Mo) thin-film bilayers irradiated with 285 keV Xe+ ions near 77 K. The results indicate that, as a group, mixing of 3d-metal/Al pairs irradiated by Xe can be explained by neither a pure binary collision cascade nor a pure thermal spike model. Such a situation should exist; that it should be found at the average atomic numbers of the present bilayers is consistent with recent theoretical predictions.


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