TITLE

Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 53, 1045 (1988)]

AUTHOR(S)
Meyer, Gerhard; Amer, Nabil M.
PUB. DATE
December 1988
SOURCE
Applied Physics Letters;12/12/1988, Vol. 53 Issue 24, p2400
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Describes a sensitive and simple optical method for detecting the cantilever deflection in atomic force microscopy. Key issues of interest; Analysis of pertinent topics and relevant issues; Implications on physics.
ACCESSION #
9829163

 

Related Articles

  • Characterization and optimization of the detection sensitivity of an atomic force... Schaffer, Tilman E.; Hansma, Paul K. // Journal of Applied Physics;11/1/1998, Vol. 84 Issue 9, p4661 

    Presents information on the characterization of an atomic force microscope (AFM) for small cantilevers, with reference to physics. Features of the microscope; Why is there an optimum signal-to-noise ratio for an intermediate aperture width; Increase in the signal-to-noise ratio of cantilever...

  • Conducting atomic force microscopy of alkane layers on graphite. Klein, David L.; McEuen, Paul L. // Applied Physics Letters;5/8/1995, Vol. 66 Issue 19, p2478 

    Investigates the layering of hexadacane on graphite using atomic force microscope (AFM) with a conducting tip. Contributions of layering to the formation of stable tunneling junctions; Use of scanning tunneling microscope to probe the electrical properties of materials on the nanometer scale;...

  • Investigation of substrate-dependent nucleation of plasma-deposited microcrystalline... Smith, L.L.; Srinivasan, E. // Journal of Applied Physics;12/15/1997, Vol. 82 Issue 12, p6041 

    Presents information on a study which investigated by means of atomic force microscopy (AFM) and reflective high energy electron diffraction, substrate-dependent nucleation of plasma-deposited microcrystallin silicon glass and silicon substrates. Characteristics of microcrystalline silicon thin...

  • Improved atomic force microscopy imaging using carbon-coated probe tips. Doris, Bruce B.; Hegde, Rama I. // Applied Physics Letters;12/18/1995, Vol. 67 Issue 25, p3816 

    Improves the quality of atomic force microscopy (AFM) imaging by using carbon-coated probe tips. Implication for hydrogen-passivated silicon and silicon dioxide surfaces scanning; Results of the surface tapping mode measurements; Reasons for the improved quality of AFM imaging and reduced probe...

  • Study on ferroelectric domains in BaTiO3 crystalline films and bulk crystals by atomic force... Tsunekawa, S.; Fukuda, T.; Ozaki, T.; Yoneda, Y.; Okabe, T.; Terauchi, H. // Journal of Applied Physics;7/15/1998, Vol. 84 Issue 2, p999 

    Examines the role of tapping-mode atomic force microscopy (TMAFM) in BaTiO3 crystalline films and bulk crystals. Characteristics of bulk crystals made by the top-seeded solution growth method; Examination of TMAFM images of a BaTiO3 crystalline film 20 nm thick; Description of four basic styles...

  • Rapid measurement of static and dynamic surface forces. Ducker, William A.; Cook, Robert F. // Applied Physics Letters;6/11/1990, Vol. 56 Issue 24, p2408 

    We present a technique for rapid measurement of surface forces using an ac force microscope. Measurement of both the amplitude and relative phase of a cantilever probe allows simultaneous and rapid determination of static and velocity-dependent forces of order nN over nm length scales. Using...

  • Publisher's Note: “The effect of set point ratio and surface Young's modulus on maximum tapping forces in fluid tapping mode atomic force microscopy” [J. Appl. Phys. 107, 044508 (2010)]. Kumar, Barath; Pfifer, Phillip M.; Giovengo, Anthony; Legleiter, Justin // Journal of Applied Physics;Mar2010, Vol. 107 Issue 6, p069905 

    The article discusses a reference link which was added to the article "The Effect of Set Point Ratio and Surface Young's Modulus on Maximum Tapping Forces in Fluid Tapping Mode Atomic Force Microscopy" in a previous issue.

  • Harmonic and power balance tools for tapping-mode atomic force microscope. Sebastian, A.; Salapaka, M. V.; Chen, D. J.; Cleveland, J. P. // Journal of Applied Physics;6/1/2001, Vol. 89 Issue 11, p6473 

    The atomic force microscope (AFM) is a powerful tool for investigating surfaces at atomic scales. Harmonic balance and power balance techniques are introduced to analyze the tapping-mode dynamics of the atomic force microscope. The harmonic balance perspective explains observations hitherto...

  • Long range constant force profiling for measurement of engineering surfaces. Howard, L. P.; Smith, S. T. // Review of Scientific Instruments;Oct92, Vol. 63 Issue 10, p4289 

    A new instrument bridging the gap between atomic force microscopes (AFMs) and stylus profiling instruments is described. The constant force profiler is capable of subnanometer resolution over a 15-µm vertical range with a horizontal traverse length of 50 mm. This long traverse length, coupled...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics