Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 53, 1045 (1988)]

Meyer, Gerhard; Amer, Nabil M.
December 1988
Applied Physics Letters;12/12/1988, Vol. 53 Issue 24, p2400
Academic Journal
Describes a sensitive and simple optical method for detecting the cantilever deflection in atomic force microscopy. Key issues of interest; Analysis of pertinent topics and relevant issues; Implications on physics.


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