Scanning tunneling microscopy of an ion-bombarded PbS(001) surface

Wilson, I. H.; Zheng, N. J.; Knipping, U.; Tsong, I. S. T.
November 1988
Applied Physics Letters;11/21/1988, Vol. 53 Issue 21, p2039
Academic Journal
Freshly cleaved (001) surfaces of single crystalline PbS were bombarded by 8 keV Kr+ ions at a dose of 3×1012 cm-2. Atomically resolved scanning tunneling microscopy (STM) images were taken showing damaged areas due to individual ion impacts. Analysis of a STM image shows a shallow impact crater, a stacking fault, displacement of Pb2+ and S2- ions from their regular surface sites, and migration of interstitials to the surface.


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