Rib profile effects on scattering in semiconductor optical waveguides

Deri, R. J.; Hawkins, R. J.; Kapon, E.
October 1988
Applied Physics Letters;10/17/1988, Vol. 53 Issue 16, p1483
Academic Journal
A novel method for studying the dependence of scattering loss on guide structure in integrated-optic semiconductor rib waveguides is presented. The results provide a simple experimental test for determining the nature of the scattering loss. Differences in scattering due to changes in epilayer structure and ribwall slope are also investigated.


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