TITLE

Novel optical approach to atomic force microscopy

AUTHOR(S)
Meyer, Gerhard; Amer, Nabil M.
PUB. DATE
September 1988
SOURCE
Applied Physics Letters;9/19/1988, Vol. 53 Issue 12, p1045
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A sensitive and simple optical method for detecting the cantilever deflection in atomic force microscopy is described. The method was incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, were successfully performed.
ACCESSION #
9828157

 

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