Novel optical approach to atomic force microscopy

Meyer, Gerhard; Amer, Nabil M.
September 1988
Applied Physics Letters;9/19/1988, Vol. 53 Issue 12, p1045
Academic Journal
A sensitive and simple optical method for detecting the cantilever deflection in atomic force microscopy is described. The method was incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, were successfully performed.


Related Articles

  • Transfer of mechanical vibrations from a sample to an AFM-cantilever - a theoretical description. Hirsekorn, S. // Applied Physics A: Materials Science & Processing;1998, Vol. 66 Issue 7, pS249 

    Abstract. Quantitative evaluation of acoustic AFM images to determine elastic, anelastic, and adhesive surface properties require the theoretical description and calculation of the transfer of mechanical vibrations from an insonified sample to an AFM-cantilever if its sensor tip is in contact...

  • Acoustic microscopy by atomic force microscopy. Rabe, U.; Arnold, W. // Applied Physics Letters;3/21/1994, Vol. 64 Issue 12, p1493 

    Fabricates an atomic force microscope to image the topography of a sample. Observation of the simultaneous surface vibration in the megahertz range; Distribution of the ultrasonic vibration amplitude; Reflection of the position-sensing light beam from the cantilever; Resolution of the acoustic...

  • On the Thermodynamics of Contact Interaction in an Atomic Force Microscope. Rekhviashvili, S. Sh. // Technical Physics;Oct2001, Vol. 46 Issue 10, p1335 

    Contact interaction in an atomic force microscope is considered in terms of the thermodynamic approach. It is shown that hysteresis observed when a sample is probed in the vertical direction is due to the surface energy-work thermodynamic cycle. The force of sample-tip interaction is calculated...

  • Atomic Force Microscope in a Contactless Mode: Peculiarities of Force Interactions. Rekhviashvili, S. Sh. // Technical Physics Letters;Jun2000, Vol. 26 Issue 6, p517 

    Forces of interaction between the atomic force microscope (AFM) probe and the surface of a solid are calculated with an allowance for the induced cantilever oscillations. A continuous approximation used in this work does not take into account discreteness of the sample and probe structures....

  • Parallel beam approximation for V-shaped atomic force microscope cantilevers. Sader, John Elie // Review of Scientific Instruments;Sep95, Vol. 66 Issue 9, p4583 

    Presents a detailed investigation of the deflection properties of the V-shaped atomic force microscope cantilever. Validity and accuracy of the parallel beam approximation provided the width and length of the parallel rectangular arms are chosen appropriately; Geometry of the V-shaped cantilever.

  • Erratum: “Atomic force microscope cantilever spring constant evaluation for higher mode oscillations: A kinetostatic method” [Rev. Sci. Instrum. 79, 025102 (2008)]. Tseytlin, Yakov M. // Review of Scientific Instruments;May2008, Vol. 79 Issue 5, p059901 

    This article presents a correction of a previously published paper on atomic force microscopes.

  • Strain relaxation at cleaved surfaces studied by atomic force microscopy. Lelarge, F.; Dehaese, O.; Kapon, E.; Priester, C. // Applied Physics A: Materials Science & Processing;1999, Vol. 69 Issue 3, p347 

    Abstract. Atomic force microscopy (AFM) in air is used to study the (110) cleaved surface of strained (100) In[sub x]Ga[sub 1-x]As/ InP heterostructures for different compositions and thicknesses of the ternary compound layers. We find that the elastic strain relaxation induces a surface...

  • Topography of cell traces studied by atomic force microscopy. Zimmermann, Heiko; Hagedorn, Rolf; Richter, Ekkehard; Fuhr, Günter // European Biophysics Journal;1999, Vol. 28 Issue 6, p516 

    Abstract Migrating adherent cells release material onto artificial substrates like glass and silicon while moving. Traces of mouse fibroblasts (L929) have been visualised by atomic force microscopy (AFM). "Non-contact" mode AFM in a liquid environment can extract topographic information from...

  • A hydrothermal atomic force microscope for imaging in aqueous solution up to 150 degrees C. Higgins, Steven R.; Eggleston, Carrick M.; Knauss, Kevin G.; Boro, Carl O. // Review of Scientific Instruments;Aug1998, Vol. 69 Issue 8, p2994 

    Presents a design of a contact atomic force microscope (AFM) for aqueous solution imaging. Features of the AFM; Advantages of the design; Details on the unit-cell scale vertical resolution of the AFM.


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics