TITLE

Piezoreflectance characterization of double-barrier resonant tunneling structures

AUTHOR(S)
Tober, R. L.; Pamulapati, J.; Oh, J. E.; Bhattacharya, P. K.
PUB. DATE
September 1988
SOURCE
Applied Physics Letters;9/5/1988, Vol. 53 Issue 10, p883
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The piezoreflectance technique has been used to optically characterize resonant tunneling structures that utilize isolated single quantum wells. The heavy- and light-hole transitions associated with the quantum wells were prominent in the spectra of samples with barrier widths ranging from 50 to 34 Ã…. Their spectral positions depended not only on quantum well and barrier thicknesses, but also significantly on the amount of carrier confinement produced by barrier height. Furthermore, variations in the magnitude of impurity transitions could be observed in the spectra of different samples.
ACCESSION #
9827972

 

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