Coherence length in quantum interference devices having periodic potential

Tsubaki, Kotaro; Tokura, Yasuhiro
September 1988
Applied Physics Letters;9/5/1988, Vol. 53 Issue 10, p859
Academic Journal
A measurement of coherence length in the quantum interference device using drain current oscillation is proposed. The coherence length for a quantum interference device, called the washboard transistor, is measured by the proposed method. The merit of this method is that the quantitative value of the coherence length is measured using only quantum interference phenomena.


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