TITLE

Simulation of extrinsic bistability of resonant tunneling structures

AUTHOR(S)
Liu, H. C.
PUB. DATE
August 1988
SOURCE
Applied Physics Letters;8/8/1988, Vol. 53 Issue 6, p485
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A simple biasing circuit for measuring current-voltage characteristics of resonant tunneling double-barrier structures exhibits extrinsic bistabilities due to oscillations, which we show through large-signal simulations.
ACCESSION #
9827678

 

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