Probing of basal planes of MoS2 by scanning tunneling microscopy

Sarid, Dror; Henson, Tammy D.; Armstrong, Neal R.; Bell, L. Stephen
June 1988
Applied Physics Letters;6/27/1988, Vol. 52 Issue 26, p2252
Academic Journal
Atomically resolved images of MoS2 have been obtained using scanning tunneling microscopy with both positively and negatively biased samples yielding the hexagonal symmetry of the surface of the crystal. Also measured were curves of tunneling current as a function of bias voltage, from which the density of states of the valence and conduction bands can be inferred.


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