TITLE

Probing of basal planes of MoS2 by scanning tunneling microscopy

AUTHOR(S)
Sarid, Dror; Henson, Tammy D.; Armstrong, Neal R.; Bell, L. Stephen
PUB. DATE
June 1988
SOURCE
Applied Physics Letters;6/27/1988, Vol. 52 Issue 26, p2252
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Atomically resolved images of MoS2 have been obtained using scanning tunneling microscopy with both positively and negatively biased samples yielding the hexagonal symmetry of the surface of the crystal. Also measured were curves of tunneling current as a function of bias voltage, from which the density of states of the valence and conduction bands can be inferred.
ACCESSION #
9827210

 

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