TITLE

Refractive indices of semiconductor films measured by waveguide cutoff spectroscopy

AUTHOR(S)
Morasca, S.; Sordo, B.; De Bernardi, C.; Meliga, M.
PUB. DATE
May 1988
SOURCE
Applied Physics Letters;5/9/1988, Vol. 52 Issue 19, p1593
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
It is shown that by measuring the cutoff wavelengths of supported modes in waveguides it is possible to determine accurately the refractive index of the guiding layer. This method has been applied to InGaAsP/InP waveguides, and their refractive indices are obtained with accuracy to the third decimal place.
ACCESSION #
9826762

 

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