Ytterbium monolayer diffusion barriers at Hg1-xCdxTe/Al junctions

Franciosi, A.; Raisanen, A.; Wall, A.; Chang, S.; Philip, P.; Troullier, N.; Peterman, D. J.
May 1988
Applied Physics Letters;5/2/1988, Vol. 52 Issue 18, p1490
Academic Journal
Single layers of Yb at the Hg1-xCdxTe(110) interface prevent Al-Te reaction and dramatically increase the Hg concentration at the interface. Synchrotron radiation photoemission studies of the interface as a function of Al deposition show a two orders of magnitude increase in the Hg/Te core intensity ratio as a result of the interlayer-induced change in atomic interdiffusion. Calculations of thermodynamic parameters following a semiempirical alloying model suggest that other rare earths should also act as effective diffusion barriers at mercury-cadmium-telluride/reactive metal junctions.


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