Dark-line observations in failed quantum well lasers

Waters, R. G.; Bertaska, R. K.
April 1988
Applied Physics Letters;4/18/1988, Vol. 52 Issue 16, p1347
Academic Journal
The electron-beam-induced current technique has been used to disclose dark-line patterns in degraded AlxGa1-xAs quantum well lasers. At least four distinct types of pattern exist, each being characteristic of a particular device structure.


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