Observation of charge-separating defects in HgCdTe using remote contact electron beam induced current

Bubulac, L. O.; Tennant, W. E.
April 1988
Applied Physics Letters;4/11/1988, Vol. 52 Issue 15, p1255
Academic Journal
A spatially resolved electron beam technique, remote contact electron beam induced current, has been developed to detect and map charge-separating defects in HgCdTe with two remote sample contacts. This technique, characterized by a high spatial resolution, ∼1 μm, and a high sensitivity (signal/noise) to fields produced by inclusions, damage, dislocations, strain, p-n junctions, and possibly compositional (band gap) and doping variations, shows promise for analyzing materials, passivation coatings, and diode arrays without making contacts to the individual devices.


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