Signal and white noise properties of edge junction dc SQUID’s

Wakai, R. T.; Van Harlingen, D. J.
April 1988
Applied Physics Letters;4/4/1988, Vol. 52 Issue 14, p1182
Academic Journal
We have fabricated and characterized the noise performance of submicron edge junction dc superconducting quantum interference devices (SQUID’s) which exhibit excellent signal properties and extremely high flux sensitivity. At frequencies above about 3 MHz, the SQUID noise is white and is in reasonable agreement with computer simulations for a thermal noise-limited detector. In one device the measured flux energy resolution is 1.6±0.5h at 1.5 K, within a factor of 2 of the quantum-limited value suggested by theoretical modeling.


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