Reflectance-difference spectroscopy system for real-time measurements of crystal growth

Aspnes, D. E.; Harbison, J. P.; Studna, A. A.; Florez, L. T.
March 1988
Applied Physics Letters;3/21/1988, Vol. 52 Issue 12, p957
Academic Journal
We describe a reflectance-difference spectroscopy system for real-time in situ optical studies of crystal growth. Either changes in surface chemistry or surface structure can be monitored depending on wavelength.


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