TITLE

Small lattice relaxation at the DX center as studied by extended x-ray absorption fine structure on Se-doped AlGaAs

AUTHOR(S)
Mizuta, M.; Kitano, T.
PUB. DATE
January 1988
SOURCE
Applied Physics Letters;1/11/1988, Vol. 52 Issue 2, p126
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Lattice relaxation at the Se DX center in Al0.38Ga0.62As was determined by the extended x-ray absorption fine structure (EXAFS). During the EXAFS measurements the deep and shallow (metastable) states of the DX center were prepared and the resultant difference of the nearest-neighbor distance around Se between the two electronic states was found to be quite small (less than 0.04 Ã…). The result is indicative of small lattice relaxation at the DX center.
ACCESSION #
9825613

 

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