Initial stages of the ion beam mixing process

Traverse, A.; Le Boité, M. G.; Névot, L.; Pardo, B.; Corno, J.
December 1987
Applied Physics Letters;12/7/1987, Vol. 51 Issue 23, p1901
Academic Journal
The grazing x-ray reflectometry technique, performed on irradiated periodic multilayers, was used to study the early stages of the ion beam mixing process. We present our first results, obtained on NiAu samples irradiated with He ions. The experimental fluence dependence of the effective diffusion coefficient is in good agreement with a calculation based on a purely ballistic process.


Related Articles

  • Low energy ion beam mixing as a tool for multilayer x-ray mirror fabrication. Schlatmann, R.; Keppel, A. // Applied Physics Letters;5/20/1996, Vol. 68 Issue 21, p2948 

    Evaluates low energy ion beam mixing as a tool for multilayer X-ray mirror fabrication. Creation of a stack of alternating layers of silicon and Mo[sub x]Si[sub x]; Measurement of composition and interfacial roughness; Reduction of absorption losses in X-ray multilayer mirrors.

  • Ion bombardment of thin layers: The effect on the interface roughness and its x-ray reflectivity (invited). Puik, E. J.; van der Wiel, M. J.; Zeijlemaker, H.; Verhoeven, J. // Review of Scientific Instruments;Jan1992, Vol. 63 Issue 1, p1415 

    In this paper we report on experiments which indicate the necessity of the use of ion-beam bombardment for e-beam deposited multilayer x-ray coatings. Measurements are described in which ion bombardment (200-300 eV Ar[sup +] ) is used to ion etch metal layers after initial deposition and during...

  • Oxygen ion beam-induced abnormal surface topographic development at Ta/Si interface. Kim, Kyung Joong; Jung, Kyung-Hoon; Moon, Dae Won // Applied Physics Letters;10/21/1996, Vol. 69 Issue 17, p2483 

    We report on an abnormal surface topographic development at a Ta/Si interface, which is believed to be one of the major sources of the irregular interface artifacts in secondary ion mass spectrometry depth profiling by oxygen ion beam. Round crater type topographic development was observed at...

  • Projection x-ray microscope powered by highly charged ions Marrs, R.E.; Marrs, R. E.; Schneider, D.H.; Schneider, D. H.; McDonald, J.W.; McDonald, J. W. // Review of Scientific Instruments;Jan1998, Vol. 69 Issue 1, p204 

    Demonstrates a projection x-ray microscope using x-rays from the radiative deexcitation of slowly highly charged ions at a target surface. Concept of projection x-ray microscopy; Extraction of ion beam from an electron beam ion trap source; Use of charged coupled device camera for x-ray detection.

  • X-ray diffractometer stage for in situ structural analysis of thin films. Johnson, R. W.; Johnson, W. L. // Review of Scientific Instruments;Dec1988, Vol. 59 Issue 12, p2568 

    A theta-two theta x-ray diffractometer stage has been developed for in situ structural characterization of thin-film samples. This stage integrates an ultrahigh vacuum dc ion-beam thin-film sample preparation chamber with the Siemens D500 x-ray diffractometer. In vacuo sample translation and...

  • Soft X-ray fluorescence and photoluminescence of Si nanocrystals embedded in SiO[sub 2]. Chang, G.S.; Son, J.H.; Chae, K.H.; Whang, C.N.; Kurmaev, E.Z.; Shamin, S.N.; Galakhov, V.R.; Moewes, A.; Ederer, D.L. // Applied Physics A: Materials Science & Processing;2001, Vol. 72 Issue 3, p303 

    Abstract. We have used ion-beam mixing to form Si nanocrystals in SiO[sub 2] and SiO[sub 2]/Si multilayers, and applied photoluminescence and soft-X-ray emission spectroscopy to study the nanoparticles. Ion-beam mixing followed by heat treatment at 1100 Celsius for 2 h forms the Si nanocrystals....

  • Combined elemental analysis of ancient glass beads by means of ion beam, portable XRF, and EPMA techniques. Sokaras, D.; Karydas, A. G.; Oikonomou, A.; Zacharias, N.; Beltsios, K.; Kantarelou, V. // Analytical & Bioanalytical Chemistry;Dec2009, Vol. 395 Issue 7, p2199 

    Ion beam analysis (IBA)- and X-ray fluorescence (XRF)-based techniques have been well adopted in cultural-heritage-related analytical studies covering a wide range of diagnostic role, i.e., from screening purposes up to full quantitative characterization. In this work, a systematic research was...

  • Measurements of L‐shell X‐ray emission lines of neonlike europium on an electron beam ion trap. Beiersdorfer, Peter; Hell, Natalie; Panchenko, Dmytro; Brown, Greg V.; Träbert, Elmar; Kelley, Richard L.; Kilbourne, Caroline A.; Porter, F. Scott // XRS: X-ray Spectrometry;Jan/Feb2020, Vol. 49 Issue 1, p21 

    We report a measurement of the two X‐ray transitions that proceed from the (1s22s22p1/253d3/2)J=1 and (1s22s1/22p63p1/2)J = 1 upper levels to the (1s22s22p6)J = 0 ground level in neonlike Eu53+ (Z = 63), that is, near the previously documented avoided crossing of the two upper levels at Z...

  • Quantitative analysis of low-energy Xe[sup +] ion bombardment damage of Si(100) surfaces using.... Lu, Z.H.; Mitchell, D.F. // Applied Physics Letters;8/1/1994, Vol. 65 Issue 5, p552 

    Analyzes the low-energy xenon (Xe) ion bombardment damage of silicon (Si) surfaces using X-ray photoelectron spectroscopy. Changes in the Si 2p core levels upon ion bombardment; Formation of amorphous Si overlayer on the Xe ion bombarded surface; Calculation of the depths of damage created at...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics