TITLE

Drude parameters of liquid silicon at the melting temperature

AUTHOR(S)
Li, K. D.; Fauchet, P. M.
PUB. DATE
November 1987
SOURCE
Applied Physics Letters;11/23/1987, Vol. 51 Issue 21, p1747
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The Drude parameters of liquid silicon at the melting temperature have been obtained from time-resolved reflectivity measurements at 1064, 532, and 355 nm following melting of an optically thick layer by a picosecond visible laser pulse. The ratio of the electron density N to the electron mass m is found to be equal to 2.17×1059 m-3 kg-1 and the relaxation time τ to be equal to 212 as. These values are compared to previous results obtained by cw ellipsometry between 1 and 0.4 μm and by nanosecond time-resolved ellipsometry of 632.8 nm.
ACCESSION #
9824989

 

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