Maximum thickness of amorphous NiZr interlayers formed by a solid-state reaction technique

Meng, W. J.; Nieh, C. W.; Johnson, W. L.
November 1987
Applied Physics Letters;11/23/1987, Vol. 51 Issue 21, p1693
Academic Journal
Formation of the equilibrium intermetallic compound NiZr in sputter deposited Ni/Zr diffusion couples is suppressed by the formation of a metastable amorphous NiZr alloy until a critical thickness of the amorphous NiZr interlayer is reached. The temperature dependence of this critical thickness is studied experimentally. A phenomenological model based on the premise of interfacial heterogeneous nucleation is proposed to understand the evolution of Ni/Zr diffusion couples.


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