Ion beam amorphization of YBa2Cu3Ox

Clark, G. J.; LeGoues, F. K.; Marwick, A. D.; Laibowitz, R. B.; Koch, R.
November 1987
Applied Physics Letters;11/2/1987, Vol. 51 Issue 18, p1462
Academic Journal
The microstructure of ion-implanted thin films of the superconductor YBa2Cu3Ox has been investigated by transmission electron microscopy. The superconducting properties of the films were dominated by large pancake-shaped grains of YBa2Cu3Ox with their c axis perpendicular to the substrate. Other grains of YBa2Cu3Ox whose c axis was parallel to the substrate formed spherulites. Irradiation with 500 keV O+ ions caused amorphous zones to appear on the grain boundaries between the pancake grains, which initially were free of amorphous or second phases. At higher dose a continuous amorphous layer 150 Å thick was formed. However, the interior of the grains showed no irradiation-induced microstructural features until they became amorphous at a dose of 3×1014 ions/cm2. The appearance of the amorphous layer on the grain boundaries at low doses accounts for the reduction in the superconducting transition temperature observed in these films.


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