TITLE

Atomic force microscopy of liquid-covered surfaces: Atomic resolution images

AUTHOR(S)
Marti, O.; Drake, B.; Hansma, P. K.
PUB. DATE
August 1987
SOURCE
Applied Physics Letters;8/17/1987, Vol. 51 Issue 7, p484
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Images of graphite surfaces that are covered with oil reveal the hexagonal rings of carbon atoms. Images of a sodium chloride surface, protected from moisture by oil, exhibit a monoatomic step. Together, these images demonstrate the potential of atomic force microscopy (AFM) for studying both conducting and nonconducting surfaces, even surfaces covered with liquids. Our AFM uses a cross of double wires with an attached diamond stylus as a force sensor. The force constant is ≊40 N/m. The resonant frequency is ≊3 kHz. The lateral and vertical resolutions are 0.15 nm and 5 pm.
ACCESSION #
9823922

 

Related Articles

  • Qualitative relationships describing height and phase images of tapping mode atomic force microscopy. An application to micro-contact-printed patterned self-assembled monolayers. Whangbo, M.H.; Bar, G.; Brandsch, R. // Applied Physics A: Materials Science & Processing;1998, Vol. 66 Issue 7, pS1267 

    Abstract. Qualitative relationships useful for interpreting height and phase images of tapping mode atomic force microscopy are derived under the approximation that the force constant of the cantilever changes slightly by the interaction of the tip with a sample surface. These relationships...

  • Torsional Resonance Mode Imaging for High-Speed Atomic Force Microscopy. Huang, Lin; Su, Chanmin // AIP Conference Proceedings;2003, Vol. 696 Issue 1, p357 

    The instrumentation of high-speed imaging has been a challenge for scanning probe-based technologies. Mechanical stability of the system, surface tracking at sharp topographic transitions and prolonging tip lifetime have been the determining factors for practical applications. In this paper we...

  • Measurement of object height in emission electron microscopy. Schertz, F.; Kutnyakhov, D.; Schuppler, S.; Nagel, P.; Nepijko, S.; Schönhense, G. // Applied Physics A: Materials Science & Processing;Feb2011, Vol. 102 Issue 2, p253 

    The possibility of measuring the height of an object in emission electron microscopy (EEM) is investigated. If the specimen is characterized by an equipotential surface with the relief h( x, y), the image is equivalent to a specimen with an ideal flat surface and a corresponding distribution of...

  • Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces. Leung, Carl; Maradan, Dario; Kramer, Armin; Howorka, Stefan; Mesquida, Patrick; Hoogenboom, Bart W. // Applied Physics Letters;11/15/2010, Vol. 97 Issue 20, p203703 

    Electrostatic forces and potentials are keys in determining the interactions between biomolecules. We have recently imaged the topography and electrostatic surface potential of nucleic acid molecules on silicon surfaces using Kelvin probe force microscopy (KPFM). Here, we demonstrate KPFM...

  • Improved atomic force microscopy imaging using carbon-coated probe tips. Doris, Bruce B.; Hegde, Rama I. // Applied Physics Letters;12/18/1995, Vol. 67 Issue 25, p3816 

    Improves the quality of atomic force microscopy (AFM) imaging by using carbon-coated probe tips. Implication for hydrogen-passivated silicon and silicon dioxide surfaces scanning; Results of the surface tapping mode measurements; Reasons for the improved quality of AFM imaging and reduced probe...

  • Rapid measurement of static and dynamic surface forces. Ducker, William A.; Cook, Robert F. // Applied Physics Letters;6/11/1990, Vol. 56 Issue 24, p2408 

    We present a technique for rapid measurement of surface forces using an ac force microscope. Measurement of both the amplitude and relative phase of a cantilever probe allows simultaneous and rapid determination of static and velocity-dependent forces of order nN over nm length scales. Using...

  • Harmonic and power balance tools for tapping-mode atomic force microscope. Sebastian, A.; Salapaka, M. V.; Chen, D. J.; Cleveland, J. P. // Journal of Applied Physics;6/1/2001, Vol. 89 Issue 11, p6473 

    The atomic force microscope (AFM) is a powerful tool for investigating surfaces at atomic scales. Harmonic balance and power balance techniques are introduced to analyze the tapping-mode dynamics of the atomic force microscope. The harmonic balance perspective explains observations hitherto...

  • Long range constant force profiling for measurement of engineering surfaces. Howard, L. P.; Smith, S. T. // Review of Scientific Instruments;Oct92, Vol. 63 Issue 10, p4289 

    A new instrument bridging the gap between atomic force microscopes (AFMs) and stylus profiling instruments is described. The constant force profiler is capable of subnanometer resolution over a 15-µm vertical range with a horizontal traverse length of 50 mm. This long traverse length, coupled...

  • Improved atomic force microscope images using microcantilevers with sharp tips. Akamine, S.; Barrett, R. C.; Quate, C. F. // Applied Physics Letters;7/16/1990, Vol. 57 Issue 3, p316 

    Novel force-sensing microcantilevers with sharp tips have been used to obtain atomic force microscope images of atomically flat, layered compounds as well as microfabricated samples with large-scale topographies. When imaging atomically flat samples using cantilevers with sharp protruding tips,...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics