TITLE

Optical anisotropy in compositionally modulated Cu-Ni films by spectroscopic ellipsometry

AUTHOR(S)
Flevaris, N. K.; Logothetidis, S.
PUB. DATE
June 1987
SOURCE
Applied Physics Letters;6/1/1987, Vol. 50 Issue 22, p1544
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Spectroscopic ellipsometry studies (1.66–5.5 eV) of Cu-Ni thin films, containing short (0.62 and 4.13 nm) lattice-commensurate modulation wavelengths, have revealed a strong anisotropy of the dielectric function. These observations are discussed, in accordance with theoretical predictions for superlattices, in terms of the coherency strains. Other possible sources of anisotropy are also discussed in conjunction with other studies.
ACCESSION #
9823117

 

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