Electro-optic sampling measurements of high-speed InP integrated circuits

Wiesenfeld, J. M.; Tucker, R. S.; Antreasyan, A.; Burrus, C. A.; Taylor, A. J.; Mattera, V. D.; Garbinski, P. A.
May 1987
Applied Physics Letters;5/11/1987, Vol. 50 Issue 19, p1310
Academic Journal
Multigigahertz waveforms in an InGaAs/InP metal-insulator-semiconductor field-effect transistor inverter circuit have been measured noninvasively using the electro-optic sampling technique with pulses from a gain-switched InGaAsP laser. Propagation delays as low as 15 ps in a single inverter stage have been measured.


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