Photothermal detection for light-scattering material by laser interferometry

Chen, L.; Zhang, S. Y.
May 1987
Applied Physics Letters;5/11/1987, Vol. 50 Issue 19, p1340
Academic Journal
A highly sensitive photothermal scheme is described, in which the photothermally induced refractive index variation is measured by a specially designed interferometry. The setup is very simple and stable in facilitating practical applications. It can be used for light-scattering samples, as well as other state samples. Some experiments for detection of both periodic and nonperiodic photothermal refractive index variation are performed.


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