TITLE

Ion milled tips for scanning tunneling microscopy

AUTHOR(S)
Biegelsen, D. K.; Ponce, F. A.; Tramontana, J. C.; Koch, S. M.
PUB. DATE
March 1987
SOURCE
Applied Physics Letters;3/16/1987, Vol. 50 Issue 11, p696
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Ion milling of electrochemically etched tungsten tips is shown to improve the characteristics for scanning tunneling microscopy. The primary mechanism for the enhancement of tip reliability is identified to be the removal of a residual oxide. A greatly decreased radius of curvature is also achieved without significantly changing the macrostructural geometry of the tip.
ACCESSION #
9822360

 

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