Differential scanning calorimetry study of solid-state amorphization in multilayer thin-film Ni/Zr

Highmore, R. J.; Evetts, J. E.; Greer, A. L.; Somekh, R. E.
March 1987
Applied Physics Letters;3/9/1987, Vol. 50 Issue 10, p566
Academic Journal
Differential scanning calorimetry (DSC) has been used to study solid-state amorphization and subsequent crystallization in sputtered multilayer Ni/Zr thin films. Initial results provide quantitative information about the thermodynamics and kinetics of these processes. An analysis of DSC data enables the activation energy and pre-exponential factor for interdiffusion of Ni and Zr in a-NiZr to be found.


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