Study of dynamic current distribution in logic circuits by Joule displacement microscopy

Martin, Y.; Wickramasinghe, H. K.
January 1987
Applied Physics Letters;1/19/1987, Vol. 50 Issue 3, p167
Academic Journal
Joule displacement microscopy, where the periodic expansion caused by Joule heating in a thin-film track carrying ac current is mapped using a focused probe, has recently been described. In this letter, we demonstrate the application of this technique to the study of current distribution within a bipolar inverting gate.


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