Temperature and intensity dependence of photorefractive effect in GaAs

Cheng, Li-Jen; Partovi, Afshin
November 1986
Applied Physics Letters;11/24/1986, Vol. 49 Issue 21, p1456
Academic Journal
The photorefractive effect in semi-insulating Cr-doped GaAs as measured by the beam coupling technique was investigated as functions of temperature (295–386 K) and intensity (0.15–98 mW/cm2 of 1.15 μm light beams from a He-Ne laser). Results show that the photorefractive effect deteriorates rapidly over a narrow range of temperature as temperature rises and that this characteristic temperature increases with the logarithm of beam intensity. The observed phenomenon is attributed to the competing effects of the dark- and light-induced conductivities.


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