TITLE

Ni-C multilayer reflectivity and photoelectron yield in the NiL-edge region

AUTHOR(S)
van Brug, H.; Bruijn, M. P.; van der Pol, R.; van der Wiel, M. J.
PUB. DATE
October 1986
SOURCE
Applied Physics Letters;10/13/1986, Vol. 49 Issue 15, p914
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We analyze measurements of the x-ray reflectivity and photoelectron yield of a Ni-C multilayer (103 layers; d=31 Å) in the NiL-edge region (700–950 eV). The measured reflectivity is shown to be consistent with the one calculated using x-ray scattering factors f1 and f2 for Ni as obtained from the photoelectron yield (∼f2). The analysis yields a new set of ‘‘effective’’ values for f1 in the NiL-edge region.
ACCESSION #
9821054

 

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