TITLE

Steady-state photocarrier grating technique for diffusion length measurement in photoconductive insulators

AUTHOR(S)
Ritter, D.; Zeldov, E.; Weiser, K.
PUB. DATE
September 1986
SOURCE
Applied Physics Letters;9/29/1986, Vol. 49 Issue 13, p791
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A new simple technique for the determination of the diffusion length in photoconductive insulators is presented. A steady-state photocarrier grating is created by two interfering laser beams, and the magnitude of the secondary photocurrent perpendicular to the grating fringes is measured. The measurement is then repeated when the two beams are incoherent. From a determination of the two photocurrents as a function of grating period the diffusion length of the photocarriers can be obtained. The method can yield accurate results to 5% of the laser wavelength.
ACCESSION #
9820946

 

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