Molecular beam epitaxial growth of a novel strained-layer superlattice system: CdTe-ZnTe

Monfroy, G.; Sivananthan, S.; Chu, X.; Faurie, J. P.; Knox, R. D.; Staudenmann, J. L.
July 1986
Applied Physics Letters;7/21/1986, Vol. 49 Issue 3, p152
Academic Journal
CdTe-ZnTe strained-layer superlattices have been grown for the first time using the molecular beam epitaxy technique. The superlattices have been grown at 285 °C. They have been characterized by electron and x-ray diffraction. The presence of satellite peaks in the x-ray spectra shows that the superlattices are of excellent quality despite the large mismatch between CdTe and ZnTe along the growth axis (Δa/a=6.4%). X-ray oscillation patterns show that the superlattices are three-dimensional crystals.


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